Mapping Equipment - List of Manufacturers, Suppliers, Companies and Products

Mapping Equipment Product List

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Brain function mapping device NIRS [OxyMon]

Brain function mapping device NIRS [OxyMon]

Monitoring brain activity using near-infrared spectroscopy.

The OxyMon (Octamon) brain function mapping/imaging device is a basic type of brain function mapping/imaging NIRS system from artinis, which is a central product in their NIRS lineup. Using near-infrared spectroscopy, it allows for non-invasive real-time observation of the changes in hemoglobin oxidation in cerebral blood flow. It enables real-time observation of brain activity during operator tasks or when a driver is maneuvering machinery.

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Portable brain function mapping device NIRS【OctaMon】

Portable brain function mapping device NIRS【OctaMon】

Portable near-infrared spectroscopy brain function mapping/imaging device

The portable brain function mapping/imaging device 【OctaMon】 is a highly portable brain function mapping/imaging NIRS system from artinis that excels in mobility. 【OctaMon】 uses near-infrared spectroscopy to non-invasively observe real-time data on the oxidation displacement of hemoglobin contained in cerebral blood flow. It consists of an 8-channel (2×4) sensor that covers the prefrontal cortex, and the subject wears a headband with the sensors attached for measurement. The measured data is transmitted via Bluetooth from a small transmitter to a control laptop, providing feedback to researchers. Subjects can observe brain activity in a more natural state without being restrained by cables or other equipment.

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EddyCus(R)TF map 2525 series

EddyCus(R)TF map 2525 series

Diverse mapping analysis is possible with user-friendly software!

The "EddyCus(R) TF map 2525 SR" is a non-contact sheet resistance mapping device capable of accurate mapping measurements of sheet resistance for low and high conductivity thin films. It features versatile mapping analysis through user-friendly software. It is suitable for mapping measurements of metal film layers, as well as monitoring the thickness of thin films and substrates. 【Features】 ■ Non-contact type ■ Real-time measurement ■ Mapping measurement of metal film layers (nm) *For more details, please refer to the PDF document or feel free to contact us.

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